PH 561: Atomic Force Microscopy

Atomic force microscopes (AFMs) are instruments that allow three-dimensional imaging of surfaces with nanometer resolution and are important enabling tools for nanoscience and technology. The student who successfully completes this course will understand the functional principles of AFMs, be able to run one, and interpret the data that are collected. The recommended background for this course is a bachelors degree in science or engineering. Students who have successfully completed PH 2510, the undergraduate version of this course, may not earn credit for PH 561.